The scanning electron microscope (SEM) enables high-precision analysis of sample surfaces. The primary source of imaging information is secondary electrons (SE), which are detected by a specialized SE-detector positioned within the high-vacuum chamber. Resolution is determined almost entirely by the achievable electron beam diameterโwhich is comparatively smallโallowing SE images to deliver exceptionally high detail. This enables our experts to evaluate even the smallest nanostructures or surface cracks with precision.
Our backscattered electron detector (BSD) enables an important imaging technique that captures primary electrons reflected from the sample surface. Backscattered electrons have higher energy than secondary electrons, and the signal intensity primarily depends on the materialโs average atomic number. This creates material contrast images, which reveal the distribution of different materials or elements within the sample.
This detector combines excellent energy resolution with a larger solid angle and an active area of 30 mmยฒ. Its light element window allows the detection of elements with atomic numbers greater than or equal to 5 (boron).
This provides you with the most important test criteria and evaluations at a glance, including detailed pages with more precise derivations.
Our standard test report includes an SE/BSD overview image of the sample, a detailed SE image (1000x magnification) and two BSD images at 50x magnification for an initial assessment of the surface (magnifications may vary).
Additionally, an EDX analysis at a predefined point on the sample surface is included in the report.
- Valid analysis of surface cleanliness: Identification of impurities and defects on a microscopic level.
- Quality assurance: Ensuring that your products comply with the highest standards and offer long-term reliability.
- Increased system safety: Clean and homogeneous surfaces minimize the risk of complications with implants and other medical technology components.
- Avoidance of production errors: Early identification of potential contamination reduces rejects and saves costs.
- Years of experience: Our expertise in analyzing dental and orthopedic implants lets us pinpoint potential weak spots and help you fix them.
- DAkkS-accredited test reports: Our test reports comply with the highest standards and are internationally recognized, offering you additional assurance and confidence.
- Modern technology: Our scanning electron microscope delivers high-resolution results that serve as basis for your informed decisions and quality improvements.